IAPWS National Contacts
IAPWS currently has 10 Members and 8 Associate Members (in four cases, this is a joint effort of neighboring countries), each represented by a national committee. Following is a list of contacts for each committee. Links to Web pages for each national committee are given if available.
IAPWS President
- Monika Nielsen
- moneb@orsted.com
- NORDIC IAPWS
- Ørsted A/S
- https://nordiciapws.org/
Executive Secretary
- Dr. Daniel G. Friend
- dg.friend@iapws.org
Argentina and Brazil
- Horacio Corti
- hrcorti@cnea.gov.ar
- CNEA
Australia
- Duncan McAllister
- duncan.mcallister@loyyangb.com
- Loy Yang B
- Griff Tilley
- chair@biapws.org
- Veolia
Canada
- Willy Cook
- wcook@unb.ca
- University of New Brunswick
- Peter Tremaine
- tremaine@uoguelph.ca
- University of Guelph
China
- Zhang Guiquan
- zhangguiquan@tpri.com.cn
- Thermal Power Research Institute
- Long Guojun
- longguojun@tpri.com.cn
- Thermal Power Research Institute
- Jan Hrubý
- hruby@it.cas.cz
- Academy of Sciences of Czech Republic
- P. Safarik
- secr.czncpws@it.cas.cz
- Academy of Sciences of Czech Republic
Egypt
- Mohamed ElSherif
- mahassan@pgesco.com
- PGESCO
France
- Currently vacant
- Karsten Meier
- karsten.meier@hsu-hh.de
- Helmut-Schmidt-Universität
- Tapio Werder
- tapio.werder@ppchem.com
- PPCHEM AG
Greece
- Antony Thanos
- a.thanos@dei.gr
- Public Power Corporation
India
- Shri Mukesh Vyas
- mvyas@forbesmarshall.com
- M/s Forbes Marshall
- Shri Aditya Kanetkar
- akanetkar@forbesmarshall.com
- M/s Forbes Marshall
Israel
- Yitzhak Nussbaum
- nuss355@gmail.com
Italy
- Alberto Giuliano Albo
- a.albo@inrim.it
- INRiM
-
Yohei Kayukawa
-
National Metrology Institute of Japan (NMIJ)
- National Institute of Advanced Science and Technology (AIST)
Netherlands
- Ludwin Daal
- ludwin.daal@blue-expert.com
- BlueXPRT bv
- David Addison
- david.addison@thermalchemistry.com
- Thermal Chemistry Ltd
- Arja Lehikoinen
- arja.lehikoinen@valmet.com
- Valmet Technologies
United States
- Allan H. Harvey
- allan.harvey@nist.gov
- National Institute of Standards and Technology
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